United States
United States Home > About Agilent > Newsroom > Electronic Measurements
Contact Us
The following product photos are available for use by the media, based on the Agilent Photography Use Policy.
Image 1: Agilent’s RF/DigRF Cross Domain Integration Platform
Download JPEG (0.15MB)
Download TIF (5.63MB)
Image 2: Agilent’s RF/DigRF RF-IC Test Platform
Download JPEG (0.12MB)
Download TIF (1.56MB)
Image 3: Agilent’s DigRF Exerciser/Analyzer
Download JPEG (0.1MB)
Download TIF (1.6MB)
Image 4: Agilent's 16901A Logic Analyzer with N4850A DigRF v3 Acquistion Probe and N4860A DigRF v3 Stimulus Probe.
Download JPEG (4.1MB)
Download TIF (10.0MB)
Image 5: Agilent's N4860A DigRF v3 Stimulus Probe enables users to simulate their RF-IC or Baseband-IC.
Download JPEG (1.7MB)
Download TIF (4.3MB)
Image 6: Agilent's N4850A DigRF v3 Acquistion Probe enables users to monitor traffic on Tx and Rx simultaneously.
Download JPEG (1.6MB)
Download TIF (3.8MB)
Image 7: Agilent's Packer Viewer performs quick analysis and debug of DigRF v3 control and I/Q packets.
Download JPEG (0.3MB)
Download TIF (1.8MB)
Image 8: N5990A-165 MIPI M-PHY receiver test software.
Download JPEG (0.2MB)
Download PNG (0.1MB)
Agilent Technologies Introduces Industry-First End-to-End DigRF V4 Measurement Solution for Mobile Handset Design (2008-October-01)
Agilent Technologies Introduces Industry’s first DigRF v3 measurement solutions for mobile handset design (2007-February-05)