On this page: Image pages are listed by the Press Release
Title when they were released. This library lists images for
up to one year.
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December
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December 13, 2007 |
Agilent Technologies Announces GoldenGate Plus for Large-Scale RFIC Simulation, Analysis and Verification |
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December 10, 2007 |
Agilent Technologies’ New Gain Compression Application Optimizes Accuracy, Speed of Amplifier Test |
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December 5, 2007 |
Agilent Technologies Expands its DisplayPort Test Capability |
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December 3, 2007 |
Agilent Technologies Announces Industry’s Most Comprehensive LTE Signal Analysis Solution for Designers of Components, Transceivers |
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November
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November 27, 2007 |
Agilent Technologies Simplifies Data Acquisition with BenchLink Data Logger Pro New Software for the 34970A and 34980Aits Data Acquisition/Switch Units |
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November 19, 2007 |
Agilent Technologies' Handheld RF Spectrum Analyzer Named Best Test and Measurement Product by EDN China Innovation Awards
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November 13, 2007 |
Agilent Technologies' Partnership with Elektrobit Corp. Provides Complete Design, Test Toolset for FlexRay Automotive Networks |
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November 13, 2007 |
Agilent Technologies' Expanded USB-Based DAQ Family Features More Standalone, Modular Solutions that Enable Scalable Systems |
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November 6, 2007 |
Agilent Technologies to Launch New Automated Optical Inspection Platform at Productronica |
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November 5, 2007 |
Agilent Technologies Enables Industry Deployment of PCI Express 2.0 with New Compliance Test Solutions |
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October
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for Press Release |
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October 30, 2007 |
TS-5040 Automotive Functional Test System |
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October 29, 2007 |
Agilent Technologies Introduces Industry’s First Probing Solution for Oscilloscope Measurements in Extreme Temperatures |
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October 23, 2007 |
Agilent Technologies' N2X Multiservices Test Solution is First to Validate IPTV Quality of Experience on IPv6 Next-Generation Networks |
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October 22, 2007 |
Agilent Technologies and Sequans to Work Together on Wave 2 Mobile WiMAX™ Protocol Test |
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October 22, 2007 |
Agilent Technologies’ VEE 8.5 Offers Enhanced Programming Environment and Support for Windows VistaTM |
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October 8, 2007 |
Agilent Technologies Introduces World's First Ethernet OAM Test Solution |
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October 8, 2007 |
Agilent Technologies' New Software Enables IPTV Service Quality Tests at the Residential Gateway |
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October 2, 2007 |
Agilent Technologies Endorsed by Quantum Data for HDMI 1.3 Testing |
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October 1, 2007 |
Agilent Technologies Introduces HDMI TMDS Signal Generator Platform for Development of High-Speed Devices |
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October 1, 2007 |
Agilent Technologies' Expanded HDMI Test Platform Meets Demands for Increasing Efficiencies, Lower Costs |
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September
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September 27, 2007 |
Agilent Technologies’ Advanced Design System Enhances Serial Link Design |
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September 24, 2007 |
Agilent Technologies Announces TD-SCDMA Calibration Application for Manufacturers of TD-SCDMA UE |
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September 19, 2007 |
Agilent Technologies’ Latest GENESYS Software Provides First-Pass RF/Microwave Accuracy, Shorter Physical Design Cycles |
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September 17, 2007 |
Agilent Technologies Introduces DDR1 Compliance Software for Infiniium Series Oscilloscope |
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September 10, 2007 |
Agilent Technologies' New Software Enables Test across AC-Coupled Patch Panels, Power-over-Ethernet Mid-Span Devices |
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September 10, 2007 |
Agilent Technologies' New LXI Attenuator/Switch Drivers Ease Design Validation, Automated Testing in A/D, Wireless Communications and Component Manufacturing |
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September 10, 2007 |
Agilent Technologies' Embedded Local Oscillator Measurement Capability Sets New Standard in RF and Microwave Test |
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September 10, 2007 |
Agilent Technologies Announces One-Box Wireless Networking Test Set for Mobile WiMAX™ Applications |
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September 5, 2007 |
Agilent Technologies Introduces Family of Handheld Digital Multimeters with Broad Capabilities for Installation, Maintenance Testing |
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September 4, 2007 |
Agilent Technologies Introduces Handheld Cable and Antenna Tester |
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September 3, 2007 |
Agilent Technologies' New Source-Corrected Noise-Figure Measurement Option Extends Single-Connection Multiple-Measurement Capabilities of the PNA-X Network Analyzer
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September 3, 2007 |
Agilent Technologies’ New EXA Signal Analyzer Breaks through Speed, Budget Barriers |
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August
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August 30, 2007 |
Agilent Technologies Introduces World's First LXI Class B Triggering Device for Precise Synchronization of Instruments over LAN |
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August 29, 2007 |
Agilent Technologies Introduces Industry’s First Oscilloscope-Based DDR3 Compliance Software |
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August 22, 2007 |
Agilent Technologies Integrates Premier 3D-Planar Electromagnetic Simulation into Genesys EDA Platform |
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August 20, 2007 |
Agilent Technologies Announces Antenna Modeling Design System with Hearing-Aid Compatibility |
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August 20, 2007 |
Agilent Technologies' New Optical Polarization Solutions Provide In-Depth Characterization of Optical Components and Systems for R&D, Manufacturing |
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August 15, 2007 |
Agilent Technologies' New Optical Polarization Solutions Provide In-Depth Characterization of Optical Components and Systems for R&D, Manufacturing |
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August 13, 2007 |
Agilent Technologies Introduces Industry’s First DisplayPort Compliance Test Solution |
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August 13, 2007 |
Agilent Technologies Announces HVMOS Package for IC-CAP that Provides Accurate, Fast Extraction for Synopsys’ Widely Adopted, HSPICE High-Voltage Model |
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August 13, 2007 |
Agilent Technologies Translates Genesys EDA Software into Five Additional Languages |
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August 6, 2007 |
Agilent Technologies Adds MIMO, Wave 2 Test Support to Three of its Premier Mobile WiMAX(TM) Measurement Solutions |
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August 1, 2007 |
Agilent Technologies’ New PXIT Modules Provide Cost-Effective Optical Transceiver Test up to 8.5 Gb/s and Beyond |
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July
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for Press Release |
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July 31, 2007 |
Agilent Technologies' Equipment Selected as Standard by Parade Technologies to Validate New DisplayPort Designs |
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July 30, 2007 |
Agilent Technologies Introduces Industry’s First Dual-Purpose 8 Gb/s Fibre Channel SAN Tester and Protocol Analyzer |
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July 27, 2007 |
Agilent Technologies Adds 7.2/2 Mbps HSPA IP Data Connection, HSUPA Measurement Capabilities that Support Test of Wireless UMTS User Equipment |
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July 24 , 2007 |
Agilent Technologies’ Time-to-Digital Converter Delivers Exceptional Performance for Precise Timing- Measurement Applications |
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July 9, 2007 |
Agilent Technologies Announces Extended Simulation Coverage, UL Receiver Capability for its 3GPP LTE Wireless Library |
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July 2, 2007 |
Agilent Technologies’ New USB-Based Sensors Provide Affordable, Simpler Power Measurements without a Power Meter |
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June
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June 28, 2007 |
Agilent Technologies Introduces Compact LXI-Compliant Power Meter that Enables Fast, Lower-Cost Startup of ATE Systems |
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June 27, 2007 |
Agilent Technologies Releases Full-Wave 3D Electromagnetic Simulation Environment for Wireless Appliance Designers |
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June 25, 2007 |
Agilent Announces Industry's First Integrated Verification Toolkit for Signal Integrity Design |
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June 18, 2007 |
Agilent Technologies Announces Third-Generation Network Tester with Industry-Leading Traffic Generation, Protocol Breadth |
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June 18, 2007 |
Agilent Technologies Introduces Industry-Leading L2-7 Integration with Hardware-Based TCP on N2X Multiservices Test Solution |
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June 12, 2007 |
Agilent Technologies Introduces Compact, Low-Power Digitizer that Maximizes Measurement Throughput |
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June 6, 2007 |
Agilent Technologies Introduces Low-Cost Service and Repair Test System with CDMA2000 Option |
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June 1, 2007 |
Agilent Technologies Introduces GPIB Interface Card that Delivers High Transfer Rate in Half-Height PCIe Card |
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May
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May 30, 2007 |
Agilent Technologies' Integrated 3D Electromagnetic Simulation and Advanced Design System EDA Platform Speeds Design, Verification |
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May 29, 2007 |
Announces 3GPP LTE Signal-Creation Software for Next-Generation Mobile Communications Products |
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May 21, 2007 |
Agilent Technologies and Solarflare Communications Demonstrate Tools that Enable Cost-Effective 10 Gigabit Ethernet Upgrades on Installed Copper Cabling |
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May 18, 2007 |
Agilent Technologies Adds Industry-First Exerciser x16, Interposer Probing to E2960B Series for PCI Express 1.0, 2.0 |
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May 8, 2007 |
Agilent Technologies Announces Strategic Partnership with Mentor Graphics on Automotive Network Design, Test and Validation Tools |
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May 1, 2007 |
Agilent Technologies Introduces Fixed, Mobile WiMAX Manufacturing Test for Consumer Premises Equipment |
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May 1, 2007 |
Agilent Technologies Introduces PLTS Version 4.0, Adds Signal Integrity Software Package Priced at less than $10,000 |
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May 1, 2007 |
Agilent Technologies Introduces AC/DC Current Probes for Accurate Measurements from DC to 100 MHz Bandwidth |
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May 1, 2007 |
Agilent Technologies Announces First and Only Signal Analyzer to Offer Complete Instrument Security via CPU and HDD Removal |
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May 1, 2007 |
Agilent Technologies Introduces the World’s First DC Power Analyzer that Performs Complex DC Sourcing and Measuring Tasks without Programming |
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May 1, 2007 |
Agilent Technologies’ N6700 Modular Power System extends industry-leading processing speeds, autoranging output, advanced measurement capabilities into higher power for ATE applications |
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April
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April 24, 2007 |
Agilent Technologies Introduces Low-Cost In-Circuit Test for Original Design Manufacturers |
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April 24, 2007 |
Agilent Technologies Launches World's Fastest 3D In-Line Automated X-Ray Inspection Solution with Uncompromised Defect Coverage |
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April 23, 2007 |
Agilent Technologies’ HDMI 1.3 Test Solution Selected for All Silicon Image Authorized Test Centers |
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April 19, 2007 |
Agilent Technologies' BSIM3 Model Extraction Package for CMOS Modeling Foundries Now Available |
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April 18, 2007 |
Agilent Technologies' 5000 Series Oscilloscopes Pack Deep-Memory Performance in a Lunchbox-Sized Instrument
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April 17, 2007 |
Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells from Days to Hours
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April 16, 2007 |
Agilent Technologies Introduces Test Platform to Measure All Entertainment Electronics in Today’s Smart Cars
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April 11, 2007 |
Agilent Technologies' Series of Handheld Oscilloscopes Named Elektronik Magazine's Product of the Year |
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April 4, 2007 |
Agilent Technologies Ships GENESYS 2007 EDA Software that Improves Productivity, Saves Time for RF and Microwave Component, Subsystem Designers |
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April 2, 2007 |
Agilent Technologies Introduces Industry’s First 1-GHz Battery-Powered Digital Storage Oscilloscopes and First Battery-Powered Mixed Signal Oscilloscopes |
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April 2, 2007 |
Agilent 4080 Series Parametric Test Systems |
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March
2007 |
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for Press Release |
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March 27, 2007 |
Agilent Technologies’ Announces its New WiMAX™ Protocol Conformance Test Solution for 802.16e 2005 |
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March 26, 2007 |
Agilent Technologies Introduces World’s First Complete Optical Receiver Stress Test Solution |
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March 26, 2007 |
Agilent Technologies’ New Signal Source Analyzer Features 10X Increase in Measurement Throughput, More Precise Analysis than Predecessor |
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March 26, 2007 |
Agilent Technologies Introduces Industry-First Lightwave Component Analyzer for Testing Multimode Electro-Optical Components at 850 nm |
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March 22, 2007 |
Agilent Technologies Introduces I/O Hardware that Enables 35-Percent Faster Transfer Rate for Instrument Testing |
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March 19, 2007 |
Agilent Technologies Introduces True-Mode Stimulus Application for Accurate Characterization of Balanced Devices in Wireless Communications, R&D and Component Test Applications |
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March 15, 2007 |
Agilent Technologies Launches Best-in-Class Low-Cost 3GHz RF Spectrum Analyzer |
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March 5 , 2007 |
Agilent Technologies Introduces Economically Priced, High-Performance Switches with Exceptional Repeatability Guaranteed |
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March 5 , 2007 |
Agilent Technologies' Series of High-Bandwidth Oscilloscopes Named "Test Product of the Year" |
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March 1, 2007 |
Agilent Technologies' First Handheld RF Spectrum Analyzer Now Available Worldwide |
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March 1, 2007 |
Agilent Technologies Introduces FET Solid-State Switches with Low Video Leakage, Industry-Leading Settling Time and High Isolation |
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March 1, 2007 |
Agilent Technologies Introduces Powerful RFID Modulation Analysis for Troubleshooting EPC Gen2 RFID Systems |
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February
2007 |
Images
for Press Release |
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February 20, 2007 |
Agilent
Technologies Introduces Electrical Performance Validation
Software to Facilitate XAUI Testing |
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February 20, 2007 |
Agilent
Technologies Introduces Fastest, Easiest Way to Bring
Power of In-Circuit Test to Production Lines |
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February 20, 2007 |
Agilent
Technologies Introduces First-Ever In-Circuit Vectorless
Test Technique with Network Parameter Measurement Technology |
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February 13, 2007 |
Agilent
Technologies and DECOMSYS Introduce First Oscilloscope-Based
Time-Correlated Measurement System for FlexRay Signals |
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February 12, 2007 |
Agilent
Technologies IP Data Connection and Inter-RAT Voice,
Data Enhancements Support Stress Test of Wireless UMTS
User Equipment |
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February 12, 2007 |
Agilent Technologies Introduces Industry's
First One-Box, Benchtop UMA/GAN Test Solution for Wireless
Communications |
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February 11, 2007 |
Agilent
Introduces Industry-First Integrated Radio-Network Analysis
Tool for 3G Wireless Networks |
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February 9, 2007 |
Agilent Technologies
and Hyper Taiwan Technology Announce Certification of
Bluetooth-Qualification Test System |
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February 5, 2007 |
Agilent
Technologies Launches Agilent Measurement Journal |
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February 5, 2007 |
Agilent
Technologies Introduces Ultra-Wideband Vector Signal
Analyzer [sf1] for Modulated Wideband Communications
Signals |
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February 5, 2007 |
Agilent
Technologies Introduces Industry’s first DigRF v3
measurement solutions for mobile handset design |
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February 1, 2007 |
Agilent
Technologies Introduces Premier-Performance Network
Analyzer for Active Device Test |
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January
2007 |
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for Press Release |
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January 31, 2007 |
Agilent
Technologies' Enhanced VEE Software Helps Engineers
Refine Designs Faster, More Easily |
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January 29, 2007
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Agilent
Technologies Expanded USB 2.0 Test Coverage Improves
Automation, Receiver Compliance Testing |
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January 29, 2007
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Agilent
Technologies Introduces the Industrys first De-Emphasis
Signal Converter for Robust Multi-Gigabit Designs |
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January 29, 2007
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Agilent
Technologies Announces Breakthrough High-Frequency SPICE
Simulation Technology for High-Speed Digital Board Design |
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January 29, 2007
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Agilent
Technologies and Xilinx Create Innovative Solution for
High-Speed Serial I/O Link Test |
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January 22, 2007 |
Agilent Technologies
Introduces Industry-First Accurate, Affordable Phase
Noise/Spectral Jitter Analysis to The Industry Leading
DCA-J Sampling Scope |
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January 22, 2007 |
(TPA
- N2X
- FS Pro):
Agilent Technologies Selected for Alcatel-Lucent’s
IPTV Test and Measurement Ecosystem |
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January 17, 2006 |
Agilent
Technologies Introduces 7 Gb/s and 12.5 Gb/s Pattern
Generators with Complete Jitter Injection |
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January 17, 2007
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Agilent
Technologies Announces Four New GENESYS EDA Software
Suites Priced under $10K |
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January 16, 2006 |
Agilent
Technologies' New Solder Paste Inspection System Offers
Manufacturers Twice the Speed, Enhanced Resolution,
Ease of Use |
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January 10, 2007 |
Agilent Technologies
Establishes new Distribution Channel for HMMC family
of Products |
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January 8, 2007 |
Agilent
Technologies Introduces J-BERT Functionality that Enables
Industry’s Fastest Jitter Tolerance Test Results |
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January 4, 2007 |
Agilent
Technologies Introduces its First Handheld RF Spectrum
Analyzer |
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January 3, 2007 |
Agilent Technologies
Announces New Automated X-ray Inspection Capabilities
with Latest Software Release |
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January 2, 2007 |
Agilent Technologies
Announces Industry's First Series of High-Frequency
Test Accessories for Communications, Military Applications |
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January 2, 2007 |
Agilent Technologies
ships first commercially available PSP modeling software |
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January 2, 2007 |
Agilent Technologies’
1xEV-DO Release A Enhancement Enables Live Data-Connection
Setup with Full Network Emulation |
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December
2006 |
Images
for Press Release |
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December 18, 2006 |
Agilent Technologies
Announces First Commercially Available 3GPP LTE Wireless
Library |
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December 14, 2006 |
Agilent
Technologies Introduces Industry’s First Oscilloscope-Based
DDR2 Compliance Test Application |
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December 04, 2006 |
Agilent Technologies'
New Draft-802.11n MIMO Test Solution Features Innovative
Analysis, Outstanding Accuracy and Fast Measurement
Speed |
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December 04, 2006 |
Agilent Technologies
Announces Industry's First Analysis Solution for HSDPA/8PSK
Over TD-SCDMA in a Spectrum Analyzer |
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December 01, 2006 |
Agilent Technologies
Introduces Digital Signal Analyzer Optimized for Serial-Data-Based
Designs |
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