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Agilent Technologies’ Zero Insertion Force (ZIF) Probe Head Extended to cover both Protocol Layer Testing for PCI Express

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The Agilent N4241Z ZIF flying leads probe 2.0 leverages the Agilent Infinimax ZIF design, allowing designers to use the same probe points for physical layer measurements as well as protocol debugging using the protocol analyzer.

Image 1:
The Agilent N4241Z ZIF flying leads probe 2.0 leverages the Agilent Infinimax ZIF design, allowing designers to use the same probe points for physical layer measurements as well as protocol debugging using the protocol analyzer.

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Agilent's N4241Z ZIF flying leads probe 2.0 is designed with reliable signals and ease of probing access in mind.

Image 2:
Agilent's N4241Z ZIF flying leads probe 2.0 is designed with reliable signals and ease of probing access in mind.

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	Related Information

	Press Release:	Agilent Technologies’ Zero Insertion Force (ZIF) Probe Head Extended to cover both Protocol Layer Testing for PCI Express (2009-October-13)
	Agilent Photography Use Policy:	We will permit use of Agilent photography available via this site as long as the use will not disparage Agilent nor imply endorsement by Agilent. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Agilent Technologies. ALL IMAGES MUST BE CREDITED TO AGILENT TECHNOLOGIES UNLESS OTHERWISE NOTED © Agilent Technologies 2009 All Rights Reserved
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