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Agilent Technologies’ New Cover-Extend Technology Eliminates the Need for Physical Test Points for In-Circuit Test

The following product photos are available for use by the media, based on the Agilent Photography Use Policy.

Image 1:
Cover-Extend leverages existing VTEP hardware such as the VTEP probes and MUX card.

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Image 2:
Cover-Extend enables unsurpassed ICT coverage on the Medalist i3070 platform.

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VTEP MUX Card

Image 3:
VTEP MUX Card

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VTEP sensor plate with probes

Image 4:
VTEP sensor plate with probes

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Related Information
  Press Release:

Agilent Technologies’ New Cover-Extend Technology Eliminates the Need for Physical Test Points for In-Circuit Test
(2008-March-20)
  Press Release:

Agilent Technologies Introduces First-Ever In-Circuit Vectorless Test Technique with Network Parameter Measurement Technology
(2007-February-20)
  Agilent Photography Use Policy:

We will permit use of Agilent photography available via this site as long as the use will not disparage Agilent nor imply endorsement by Agilent. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Agilent Technologies.

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