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Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells from Days to Hours

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A new waveform generator / fast measurement unit (WGFMU) for the Agilent B1500A semiconductor device analyzer performs the high-speed measurements required to characterize ultrafast Negative Bias Temperature Instability (NBTI) and other applications such as pulsed IV and Random Telegraph Signal (RTS). It is offered in two versions: the B1530A for general-purpose fast-measurement applications, and the B1543A for advanced NBTI testing. It is the first self-contained module to offer the combination of arbitrary linear waveform generation (ALWG) with synchronized fast current or voltage (IV) measurement as fast as 5 ns (nanoseconds), enabling accurate high-speed IV characterization.

Image 1: The Agilent B1500A Semiconductor Device Analyzer
A new waveform generator / fast measurement unit (WGFMU) for the Agilent B1500A semiconductor device analyzer performs the high-speed measurements required to characterize ultrafast Negative Bias Temperature Instability (NBTI) and other applications such as pulsed IV and Random Telegraph Signal (RTS). It is offered in two versions: the B1530A for general-purpose fast-measurement applications, and the B1543A for advanced NBTI testing. It is the first self-contained module to offer the combination of arbitrary linear waveform generation (ALWG) with synchronized fast current or voltage (IV) measurement as fast as 5 ns (nanoseconds), enabling accurate high-speed IV characterization.

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Related Information
  Press Release:

Agilent Technologies Introduces Industry-First Waveform Generator / Fast Measurement Unit for NBTI Application, High-Speed IV Characterization
(2008-April-21)
  Press Release:

Agilent Technologies Wins EuroAsia 2007 IC Industry Award
(2007-July-19)
  Press Release:

Agilent Technologies Reduces Endurance Test Time for Non-Volatile Memory Cells from Days to Hours
(2007-April-17)
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